High electroencephalographic seizure exposure is associated with unfavorable outcomes in neonates with hypoxic-ischemic encephalopathy


Hypoxic-ischemic encephalopathy (HIE) is a common cause of clinical and non-convulsive (subclinical) electroencephalographic seizures (ES) among neonates and remains a substantial cause of death and neurodevelopmental disability [1]. Historically, morbidity and mortality from HIE were high; however, the implementation of therapeutic hypothermia has led to significant reductions in death and neurodevelopmental disability [2–8]. Since therapeutic hypothermia became the standard of care for neonatal HIE treatment, studies have identified several factors that are predictive of unfavorable neurodevelopmental outcomes, including the clinically assessed degree of encephalopathy, the amount of brain injury evident on MRI, abnormal EEG background features, and high seizure exposure [9–15].


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